[ARM,4/6] Improve Neon intrinsics testsuite.

On 30 July 2012 12:41, Ramana Radhakrishnan
<ramana.radhakrishnan@linaro.org> wrote:
> Hi,
>      I've been working on a small project to improve neon intrinsic
> and  I kept getting bothered by random failures in gcc.target/arm/neon
> and I got sufficiently irritated that I decided to clean that bit up
> and then found myself in a maze of rabbit holes. I've always been
> somewhat bothered by the Neon intrinsics tests and took the
> opportunity to actually do some proper cleanup work in that space.
> It's not as good as having proper execute tests but this is certainly
> better than the tests that are in place today.
>
> Patch 1 fixes up the vaba and vabal patterns to use a canonical RTL
> form with the first operand to the plus being the more complex one.
> Patch 2 is a bug fix that fixes up the splitters so that they take
> into account the right register for the right mode . For instance a
> register not fit for a TImode value shouldn't be put in one even if
> the larger mode allows a different register . This is possible for
> OImode values or indeed HFA style values being passed around as
> parameters and is potentially an issue for folks building hard-float
> systems with neon and using some of the large structures.
> Patch 3 fixes up the costs so that lower-subreg doesn't go bonkers
> with splitting large values before it is visible . More in the actual
> patch description. It is possibly the most contentious of the lot and
> could do with some review. I think there is still quite a lot more to
> be done around costs for some of the vector operations.
> Patch 4 - Improves the testsuite for the Neon intrinsics.  There are
> still testisms for a number of these but it boils down to the regexps
> needing to be corrected for a number of these tests. I thought before
> I spend more time on ML wrangling , I should get this out for some
> review. Again a contentious one and probably could do with some
> discussion.

   This patch converts the testsuite generator to actually produce
something more sensible than the current set of tests. It changes
these to generate the following form for a test instead of the previous
set of tests.

It's careful to use the hard-fp variant so that we actually
produce an instruction (atleast a move of the appropriate form) and
uses a dummy floating point parameter to ensure this. This ensures that
most tests are alright. This does increase test times quite a bit
and I'm considering a follow-up to the build system that tries to do
some of these tests in parallel.

It's been useful and instructive so far and has found a few issues
in the compiler and probably been the twistiest passage in this maze
of twisty little passages.

There are still failures in these tests and some of them are down to testisms
and some them down to real issues which I'm still looking at. I'm only attaching
the non-autogenerated parts with the patch.

Thoughts ?

Ramana

2012-07-27  Ramana Radhakrishnan  <ramana.radhakrishnan@linaro.org>

    	* config/arm/neon-testgen.ml: Update copyright years.
    	(emit_prologue): Do not restrict runs to O0. Remove function start.
    	(emit_automatics): Rename to emit_test_prologue.
    	(emit_test_prologue test_name const_valuator): Additional parameters.
    	(emit_test_prologue print_arg print_args): New routines.
    	(emit_test_prologue): Update comment. Print test_name. Convert
    	automatics to function parameters and use above.
    	(emit_call): Handle printing of return value and close off
    	test function.
    	(emit_epilogue): Delete printing of end of function.
    	(test_intrinsic): Adjust calls to changed functions.

    	testsuite/
    	* gcc.target/arm/neon/neon.exp: Update copyright year and
    	change into a torture test.
    	* gcc.target/arm/neon/*.c: Regenerate.

    /* Test the `vaddf32' ARM Neon intrinsic.  */
    /* This file was autogenerated by neon-testgen.  */

    /* { dg-do assemble } */
    /* { dg-require-effective-target arm_neon_ok } */
    /* { dg-options "-save-temps" } */
    /* { dg-add-options arm_neon } */

    float32x2_t __attribute__ ((pcs ("aapcs-vfp")))
    test_vaddf32 (float dummy_param, float32x2_t  arg0_float32x2_t,
    	float32x2_t  arg1_float32x2_t)
    {
      float32x2_t out_float32x2_t;

      out_float32x2_t = vadd_f32 (arg0_float32x2_t, arg1_float32x2_t);
      return out_float32x2_t;
    }

    /* { dg-final { scan-assembler "vadd\.f32\[ 	\]+\[dD\]\[0-9\]+,
\[dD\]\[0-9\]+, \[dD\]\[0-9\]+!?\(\[ 	\]+@\[a-zA-Z0-9 \]+\)?\n" } } */
    /* { dg-final { cleanup-saved-temps } } */

[ARM,4/6] Improve Neon intrinsics testsuite.

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